PHOTOMETRIC
MEASUREMENT
Surface
Measurements
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Light
interaction with the materials surfaces is a key issue for accurate
simulations. By measuring light scattering , by building simulation
models for light scattering, by constantly developing our measurement
instruments, OPTIS has increased its understanding of light and matter
interaction. |
Generally
speaking, a surface can be characterised by its BRDF (Bidirectionnal Reflectance
Distribution Function) that describes the way the light interacts with
the surface material.
Simpler models can be applied when the surface shows a specific behaviour.
Many surfaces as mate materials can be considered as lambertian. Glossy
paintings have a specular behaviour, rough surfaces can be modelled with
a gaussian distribution of the reflected light around the normal direction
etc
These models
are used in SPEOS in the simple and the advanced scattering model. Sometimes,
the BRDF measurement cannot be fitted in SPEOS model because the material
shows an anisotropic behaviour on reflection (holograms, specific diffusers,
textured surfaces etc
)
The surface
can also be characterised by the BTDF (Bidirectionnal Transmittance Distribution
Function) that described the way the light is transmitted by the material.
This property can be assigned to a transmissive surface without taking
into account the thickness of the material. This assumption is true for
thin materials. If the sample is thick, some light can be coupled into
the material (specially for high incidences), the measurement has to be
done differently.
Material
Measurements
OPTIS has developed specific bench equipment to characterize and model
your material.
Precise
measurements are done by OPTIS. Data are directly compatible with SPEOS.
Lamps Measurements
OPTIS has developed specific bench equipment to characterize and model
your source. Precise measurements are done by OPTIS. Data are directly
compatible with SPEOS. If you want us to generate your library, please
contact us.
Spectrum Measurements
OPTIS has developed specific bench equipment to characterize and model
the emission spectrum of your source. Data are directly compatible with
SPEOS. If you want us to generate your library, please contact us.
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